From 32dd4d10d013e0dcfc815bdd66ea035f589ed9d8 Mon Sep 17 00:00:00 2001
From: Bo Chen <chen.bo@intel.com>
Date: Thu, 2 Dec 2021 06:47:05 -0800
Subject: [PATCH] tests: Temporarily disable test_vfio_user

This test is flaky (#3400) while we are experiencing a bug of using the latest
SPDK/NVMe backend as VFIO user device (#3401). Let's disable this test
before we fix the above two issues.

Signed-off-by: Bo Chen <chen.bo@intel.com>
---
 tests/integration.rs | 1 +
 1 file changed, 1 insertion(+)

diff --git a/tests/integration.rs b/tests/integration.rs
index ecf2d6480..8b6123375 100644
--- a/tests/integration.rs
+++ b/tests/integration.rs
@@ -5975,6 +5975,7 @@ mod tests {
         }
 
         #[cfg(target_arch = "x86_64")]
+        #[ignore]
         #[test]
         fn test_vfio_user() {
             let focal = UbuntuDiskConfig::new(FOCAL_IMAGE_NAME.to_string());