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tests: Increase timeout after vfio-user device hotplug

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As reported by the periodic CI runs, it may take more time for the NVMe
device to present in the guest after being hotplugged as a VFIO user
device on `aarch64` (especially under high load). Let's increase the
timeout after device hotplug from `1s` to `10s` to increase the test
stability.

Fixes: #3495

Signed-off-by: Bo Chen <chen.bo@intel.com>
This commit is contained in:
Bo Chen 2022-03-28 09:28:31 -07:00 committed by Rob Bradford
parent 3679be3721
commit cec035c6e0
1 changed files with 1 additions and 1 deletions
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2
tests/integration.rs
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@ -5810,7 +5810,7 @@ mod parallel {
assert!(String::from_utf8_lossy(&cmd_output)
.contains("{\"id\":\"vfio_user0\",\"bdf\":\"0000:00:06.0\"}"));
thread::sleep(std::time::Duration::new(1, 0));
thread::sleep(std::time::Duration::new(10, 0));
// Check both if /dev/nvme exists and if the block size is 128M.
assert_eq!(