cloud-hypervisor/tests
Bo Chen 32dd4d10d0 tests: Temporarily disable test_vfio_user
This test is flaky (#3400) while we are experiencing a bug of using the latest
SPDK/NVMe backend as VFIO user device (#3401). Let's disable this test
before we fix the above two issues.

Signed-off-by: Bo Chen <chen.bo@intel.com>
2021-12-02 12:43:11 +01:00
..
integration.rs tests: Temporarily disable test_vfio_user 2021-12-02 12:43:11 +01:00