Bo Chen cec035c6e0 tests: Increase timeout after vfio-user device hotplug ...

As reported by the periodic CI runs, it may take more time for the NVMe
device to present in the guest after being hotplugged as a VFIO user
device on `aarch64` (especially under high load). Let's increase the
timeout after device hotplug from `1s` to `10s` to increase the test
stability.

Fixes: #3495

Signed-off-by: Bo Chen <chen.bo@intel.com>

2022-03-31 09:22:07 +01:00

..

integration.rs

tests: Increase timeout after vfio-user device hotplug

2022-03-31 09:22:07 +01:00