Bo Chen cec035c6e0 tests: Increase timeout after vfio-user device hotplug ... As reported by the periodic CI runs, it may take more time for the NVMe device to present in the guest after being hotplugged as a VFIO user device on `aarch64` (especially under high load). Let's increase the timeout after device hotplug from `1s` to `10s` to increase the test stability. Fixes: #3495 Signed-off-by: Bo Chen <chen.bo@intel.com>		2022-03-31 09:22:07 +01:00
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integration.rs	tests: Increase timeout after vfio-user device hotplug	2022-03-31 09:22:07 +01:00